US Patent Issued to Advantest on Nov. 18 for "Apparatus and method for 2-phase cooling of test array and condensation prevention during device testing" (California Inventor)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,376, issued on Nov. 18, was assigned to Advantest Corp. (Tokyo).

"Apparatus and method for 2-phase cooling of test array and condensation prevention during device testing" was invented by Peter Weixiang Zheng (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments disclosed herein provide cooling for a test array (e.g., a semiconductor test array) using a 2-phase refrigerant. Testing can be performed without any added insulation, which improves test site density significantly. The refrigerant can be provided by any suitable refrigerant source, such as a pump or valve-controlled pressure chamber, for example, and can be provided ...