US Patent Issued to Advantest on March 11 for "Lockless log and error reporting for automatic test equipment" (California Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,248,390, issued on March 11, was assigned to Advantest Corp. (Tokyo).

"Lockless log and error reporting for automatic test equipment" was invented by Chi Yuan (San Jose, Calif.) and Srdjan Malisic (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Device testing techniques including allocating a log memory, testing a device, and storing test result during testing of the device in the allocated log memory. The allocated log memory can be accessed through an application programming interface (API) during testing of the device, wherein the allocated log memory remains unlocked during testing of the device."

The patent was filed on March 30,...