ALEXANDRIA, Va., June 4 -- United States Patent no. 12,321,054, issued on June 3, was assigned to ADVANTEST Corp. (Tokyo).
"Optical testing apparatus" was invented by Toshihiro Sugawara (Gunma, Japan) and Takao Sakurai (Miyagi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to the present invention, an optical testing apparatus is used in testing an optical measuring instrument. The optical measuring instrument provides an incident light pulse from a light source to an incident object and receives a reflected light pulse as a result of reflection of the incident light pulse at the incident object. The optical testing apparatus includes a testing light source and a rise time control section. T...