ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,719, issued on Jan. 13, was assigned to ADVANTEST Corp. (Tokyo).
"Magnetic field measuring apparatus" was invented by Yoshiyuki Hata (Miyagi, Japan), Hisao Hori (Niigata, Japan) and Bunichi Kakinuma (Miyagi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic field measuring apparatus for measuring a to-be-measured magnetic field includes a magnetic impedance element with an impedance change rate that changes depending on the to-be-measured magnetic field, a drive signal providing section and a measurement range setting section. The drive signal providing section provides a drive signal to the magnetic impedance element. A measurement ra...