US Patent Issued to Advantest on Feb. 4 for "Systems and methods of testing devices using CXL for increased parallelism" (California Inventor)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,163, issued on Feb. 4, was assigned to Advantest Corp. (Tokyo).

"Systems and methods of testing devices using CXL for increased parallelism" was invented by Edmundo De La Puente (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present invention can selectively enable 16 lane (x16) or 8 lane (x8) device testing using multiplexor circuitry disposed between a CXL1.1 CPU and the DUTs during testing. In this way, parallelism and testing efficiency are significantly improved compared to existing approaches that can only test devices using 8 lanes of the CXL 1.1 CPU."

The patent was filed on Feb. 3, 2023, under Applicatio...