US Patent Issued to Advantest on Feb. 4 for "Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test" (California Inventors)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,559, issued on Feb. 4, was assigned to Advantest Corp. (Tokyo).

"Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test" was invented by Srdjan Malisic (San Jose, Calif.) and Chi Yuan (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a multiple-name-space testing system comprises a load board, testing electronics, and a namespace testing tracker. The load board is configured to couple with a plurality of devices under test (DU...