US Patent Issued to Advantest on April 29 for "Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback" (German Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,366, issued on April 29, was assigned to Advantest Corp. (Tokyo).

"Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback" was invented by Andreas Hantsch (Heidelberg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An embodiment is an automated test equipment (ATE) for testing a device under test (DUT) which is connected to the ATE via a load board. The ATE includes a stimulus module, a measurement module, a loopback, a first switch, a second switch, and a load board interface. The load board interface includes a first radio frequen...