ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,693, issued on April 15, was assigned to ADVANTEST Corp. (Tokyo).

"Electronic component handling apparatus, electronic component testing apparatus, electronic component testing method" was invented by Matthias Werner (Boeblingen, Germany) and Takashi Hashimoto (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic component handling apparatus pressing the DUT against a socket electrically connected to a tester, includes: a first receiver that receives, from the tester, a first signal indicating a detection value of a temperature detection circuit; a calculator that calculates a temperature of the DUT based on the first signal; a calibrat...