ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,926, issued on March 4, was assigned to ADVANTEST Corp. (Tokyo) and TOEI SCIENTIFIC INDUSTRIAL Co. LTD. (Sendai, Japan).
"Test apparatus" was invented by Naoyoshi Watanabe (Tokyo), Shigeyuki Sato (Sendai, Japan) and Ryoichi Utsumi (Sendai, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test apparatus tests a wafer under test on which devices under test each including magnetoresistive memory or a magnetic sensor are formed. In a test process, the wafer under test is mounted on a stage. In the test process, a magnetic field application apparatus applies a magnetic field BEX to the wafer under test. A test probe card is used in the test process...