US Patent Issued to ADVANCED TERAHERTZ SYSTEMS (SUZHOU) on Jan. 27 for "Linear array scanning device and control method" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,463, issued on Jan. 27, was assigned to ADVANCED TERAHERTZ SYSTEMS (SUZHOU) Co. LTD. (Suzhou, China).

"Linear array scanning device and control method" was invented by Huanglin Yang (Suzhou, China) and Yang Wu (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A linear array scanning device includes: an object carrying assembly configured to carry a to-be-detected magnetic sample; a first magnetic field generation assembly configured to generate a first gradient magnetic field; a light source assembly configured to output linearly polarized light; a first light splitting assembly disposed on an emergent light path of the light source asse...