US Patent Issued to Advanced Micro Devices on May 27 for "Technique for testing ray for intersection with oriented bounding boxes" (British, American Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,069, issued on May 27, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"Technique for testing ray for intersection with oriented bounding boxes" was invented by Sean Keely (Austin, Texas) and Daniel James Skinner (Milton Keynes, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A technique for performing ray tracing operations is provided. The technique includes determining error bounds for a rotation operation for a ray; selecting a technique for determining whether the ray intersects a bounding box based on the error bounds; and determining whether the ray hits the bounding box based on the selected technique."

The p...