US Patent Issued to Advanced Micro Devices on Dec. 23 for "DRAM ECC circuit error detection integrity" (California, Idaho Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,014, issued on Dec. 23, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"DRAM ECC circuit error detection integrity" was invented by Aaron John Nygren (Boise, Idaho) and Eric M. Scott (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations herein describe a system including a system-on-chip including at least a host and a dynamic random-access memory (DRAM) in communication with the SoC, the DRAM including at least an error correction code engine, the system configured to allow the host to write first data to the DRAM, calculate parity bits for the first write data, store the first write data and the pa...