ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,284, issued on Dec. 2, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).
"Testing multi-cycle paths using scan test" was invented by James A. Wingfield (Austin, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "A disclosed technique includes based on a clock pattern, determining an enable configuration for setting enable signals for one or more multi-cycle paths of a hardware logic network, setting the enable configuration for the one or more multi-cycle paths, and executing testing operations for the hardware logic network with the one or more multi-cycle paths enabled according to the enable configuration."
The patent was filed...