US Patent Issued to Advanced Micro Devices on Dec. 16 for "Testing parity and ECC logic using MBIST" (Texas, Massachusetts Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,959, issued on Dec. 16, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"Testing parity and ECC logic using MBIST" was invented by Balatripura S. Chavali (Austin, Texas), Chetana Nagendra Keltcher (Boxborough, Mass.) and William Andrew Halliday (Paige, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device used for MBIST is provided which comprises a data storage structure configured to store data, data protection circuitry configured to add at least one protection bit to corresponding portions of the data written to the data storage structure, data protection checking circuitry configured to identify one or more...