US Patent Issued to Advanced Micro Devices on Aug. 5 for "Phase detection techniques for half-shield phase-detect sensors" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,257, issued on Aug. 5, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.).

"Phase detection techniques for half-shield phase-detect sensors" was invented by Wei-Chih Hung (Hsinchu, Taiwan), Po-Min Wang (Hsinchu, Taiwan) and Yu-Huai Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for performing phase detect operations are described. The techniques include obtaining first measurements with a set of half-shield phase-detect sensors; obtaining second measurements with a set of non-phase detect sensors that are not configured as phase-detect sensor; and determining a phase difference based on the first measur...