US Patent Issued to ADP on Jan. 28 for "Data quality management system" (New York Inventors)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,495, issued on Jan. 28, was assigned to ADP Inc. (Roseland, N.J.).

"Data quality management system" was invented by Eitan Klein (New York), Mohammed Ahmed (New York) and Jonathan Baier (New York).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method for managing data quality is provided. The method comprising determining, by a rule engine, a number of critical data points in a number of different software modules. A classifier is identified based on a data type of the critical data points, and the classifier is bound to the critical data points. The classifier scans the critical data points for anomality to verify an ability to...