US Patent Issued to Adeia Imaging on Oct. 7 for "Systems and methods for estimating depth and visibility from a reference viewpoint for pixels in a set of images captured from different viewpoints" (California Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,432, issued on Oct. 7, was assigned to Adeia Imaging LLC (San Jose, Calif.).

"Systems and methods for estimating depth and visibility from a reference viewpoint for pixels in a set of images captured from different viewpoints" was invented by Florian Ciurea (Campbell, Calif.), Kartik Venkataraman (San Jose, Calif.), Gabriel Molina (Grass Valley, Calif.) and Dan Lelescu (Morgan Hill, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems in accordance with embodiments of the invention can perform parallax detection and correction in images captured using array cameras. Due to the different viewpoints of the cameras, parallax results in variatio...