US Patent Issued to ACS Thermal on July 29 for "Electrothermal characterization of micro-scale and nano-scale samples and related systems" (California, Iowa, New Hampshire Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,489, issued on July 29, was assigned to ACS Thermal LLC (Exeter, N.H.).

"Electrothermal characterization of micro-scale and nano-scale samples and related systems" was invented by Guoqing Liu (Pasadena, Calif.), Richard S. Ploss (Exeter, N.H.) and Xinwei Wang (Ames, Iowa).

According to the abstract* released by the U.S. Patent & Trademark Office: "Transient techniques for electrothermal characterization of small (e.g., micro-scale or nano-scale) samples are described. These techniques overcome some of the limitations existing in conventional approaches. These transient techniques involve causing a temperature variation inside a sample, and determining a transient signal response ...