US Patent Issued to Accenture Global Solutions on Sept. 30 for "Corrupted sensors detection in sensor consortium" (Indian Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,366, issued on Sept. 30, was assigned to Accenture Global Solutions Ltd. (Dublin).

"Corrupted sensors detection in sensor consortium" was invented by Satyasai Srinivas Abbabathula (Bangalore, India), Nataraj Kuntagod (Bangalore, India), Sanjay Podder (Thane, India), Venkatesh Subramanian (Bangalore, India), Kuntal Dey (Rampurhat, India) and Senthil Kumar Kumaresan (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detection of a corrupted sensor including providing a first sensor; identifying one or more correlating sensors to the first sensor; determining a correlation between the first sensor and the correlating sensors...