ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,707, issued on Dec. 9, was assigned to ABLIC Inc. (Nagano, Japan).
"Control device and overcurrent detection and testing method for DC/DC converter and manufacturing method for control device thereof" was invented by Yoshiomi Shiina (Nagano, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A DC/DC converter is able to test an overcurrent detection circuit without damaging the circuit. The DC/DC converter includes: a high-side switch; an IV conversion element and a current detection transistor which are connected in parallel with the high-side switch; a low-side switch; an overcurrent detection circuit; and a control circuit which outputs a first ...