US Patent Issued to ABBERIOR INSTRUMENTS on Nov. 4 for "Method and microscope for recording trajectories of individual particles in a sample" (German Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,009, issued on Nov. 4, was assigned to ABBERIOR INSTRUMENTS GMBH (Gottingen, Germany).

"Method and microscope for recording trajectories of individual particles in a sample" was invented by Benjamin Harke (Gottingen, Germany), Lars Kastrup (Gottingen, Germany) and Christian Wurm (Gottingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention is directed to a method for recording a motion trajectory of an individual particle in a sample and to a light microscope performing this method. Starting from an at least approximately known initial position, the particle is scanned with an intensity distribution of a scanning light comprising a...