US Patent Issued to ABBERIOR INSTRUMENTS on March 25 for "Method of disturbance correction, and laser scanning microscope having disturbance correction" (German Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,329, issued on March 25, was assigned to ABBERIOR INSTRUMENTS GMBH (Gottingen, Germany).

"Method of disturbance correction, and laser scanning microscope having disturbance correction" was invented by Benjamin Harke (Gottingen, Germany), Roman Schmidt (Gottingen, Germany) and Lars Kastrup (Gottingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure is directed to a method of disturbance correction and to a laser scanning microscope carrying out this method. Specifically, it is directed to an image recording method according to the MINFLUX principle, in which a spatially isolated fluorescence dye molecule is illuminated ...