US Patent Issued to ABBERIOR INSTRUMENTS on Dec. 30 for "Method and apparatus for high-resolution localization of a single emitter in multiple spatial directions" (German Inventor)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,740, issued on Dec. 30, was assigned to ABBERIOR INSTRUMENTS GMBH (Gottingen, Germany).

"Method and apparatus for high-resolution localization of a single emitter in multiple spatial directions" was invented by Roman Schmidt (Gottingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to MINFLUX nanoscopy. The present disclosure improves three-dimensional localization of isolated emitters, particularly of isolated fluorescent emitters. The utilization of the emitted photons of isolated excitable emitters, in particular of isolated excitable fluorescent emitters, for a three-dimensional localization is improved by...