US Patent Issued to ABB SCHWEIZ on May 27 for "Method for monitoring a first machine and a second machine, sensor set, and use of a sensor set for monitoring a first machine and a second machine" (Indian, Polish, Swiss Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,040, issued on May 27, was assigned to ABB SCHWEIZ AG (Baden, Switzerland).

"Method for monitoring a first machine and a second machine, sensor set, and use of a sensor set for monitoring a first machine and a second machine" was invented by Manuel Oriol (Zurich, Switzerland), Maciej Orman (Malopolskie, Poland), Pallavi Hujband (Bangalore, India) and Neethu Thusath Pradeep (Kerala, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for monitoring a first machine and a second machine is described. The machines are rotating machines. Sensor devices are coupled to the machines. The method includes synchronizing a first sensor device and a se...