ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,273, issued on May 27, was assigned to ABB Schweiz AG (Baden, Switzerland).
"Method and apparatus for determining object location" was invented by Yichao Mao (Zhejiang, China), Ye Tian (Shanghai) and Jiafan Zhang (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present disclosure provide methods for determining an object location of an object. In the method, a group of measurement locations for a group of feature marks in the object are collected from a group of sensors, respectively. A group of estimation locations are obtained for the group of feature marks based on the object location and a group of offsets between the ...