US Patent Issued to A&D on Jan. 20 for "Weighing apparatus having an abnormality detection means" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,593, issued on Jan. 20, was assigned to A&D COMPANY Ltd. (Tokyo).

"Weighing apparatus having an abnormality detection means" was invented by Hideki Otsuka (Saitama, Japan) and Tsutomu Kowa (Saitama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a weighing apparatus that enables occurrence of an abnormality to be noticed. A weighing apparatus includes a rectangular weighing base, weighing sensors disposed at four corners of the weighing base, a control unit configured to calculate a weighed value of a to-be-weighed object on the weighing base based on outputs of the weighing sensors, and an abnormality detection means configured to...