ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,344, issued on Sept. 23.
"Specimen testing machine" was invented by Sang Nim Han (Daejeon, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a specimen testing machine which includes: a specimen test unit comprising: a pair of gripper parts configured to respectively hold opposite ends of a specimen, a gripper fixing part configured to fix at least any one of the pair of gripper parts, and a specimen driving part configured to move the specimen in a longitudinal direction of the specimen; and a guide plate unit including: a guide plate that is configured to be moved along with a folding direction of the sp...