ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,418,637, issued on Sept. 16.
"Product target quality control system" was invented by Raf Peeters (San Mateo, Calif.), Pieter Boogaerts (Sint-Katelijne-Waver, Belgium), Jef de Busser (Geel, Belgium), Antoon de Cleen (Diest, Belgium), Simon Kerkhofs (Zonhoven, Belgium) and Pieter Ieven (Genk, Belgium).
According to the abstract* released by the U.S. Patent & Trademark Office: "A process includes receiving a target quality value, receiving a measured quality value, receiving a source quality value, and sending a source control instruction. The source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value. The ...