ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,831, issued on Oct. 7.
"Normalization of detecting and reporting failures for a memory device" was invented by Randall J. Rooney (Boise, Idaho) and Gregg D. Wolff (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatuses related to detecting and reporting failures for a memory device are described. When a count of bit-flip errors is above a fail threshold, a memory device can report a failure. Failure reports can indicate a rate at which the memory device is accumulating errors. An offset fail threshold may be applied instead of a default fail threshold, such as a standardized or specified threshold. The offset fa...