US Patent Issued on Oct. 28 for "Measurement device for measuring light, measurement system and measurement method for detecting light parameters" (German Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,161, issued on Oct. 28.

"Measurement device for measuring light, measurement system and measurement method for detecting light parameters" was invented by Oliver Lischtschenko (Ludersdorf, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a measurement device (10) for measuring light (200) from a light source (2), comprising an optical unit (30) with a delay element (31) for splitting a polarized light beam (210) of the light (200) into a first partial beam (211) and a second partial beam (212), which have a defined phase shift relative to one another. Furthermore, the invention relates to a measurement system (1), as w...