ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,912, issued on Nov. 25.
"Machine learning model bias detection" was invented by Elhanan Mishraky (Nofim, Israel), Aviv Ben Arie (Ramat Gan, Israel), Natalie Grace De Shetler (Los Angeles), Shir Meir Lador (Givat Shmuel, Israel) and Yair Horesh (Kfar-Saba, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the present disclosure provide techniques for detecting latent bias in machine learning models. Embodiments include receiving a data set comprising features of a plurality of individuals. Embodiments include receiving identifying information for each individual of the plurality of individuals. Embodiments include predicting, for each ...