ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,746, issued on Nov. 18.
"Enhanced reliability by waveform analysis in 5G/6G communications" was invented by David E. Newman (Poway, Calif.) and R. Kemp Massengill (Palos Verdes, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Corrupted messages in 5G and 6G are usually discarded, leading to a retransmission with its added costs, delays, and background generation. Therefore, disclosed herein are methods for a wireless receiver to determine which message elements are faulted, and in many cases to correct them, based on parameters of the waveform signal in each message element. Multiple parameters may be combined for better sensitivity to the fau...