US Patent Issued on Nov. 18 for "Automatic correction of spherical aberration in selective plane illumination microscopy" (French Inventor)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,561, issued on Nov. 18.

"Automatic correction of spherical aberration in selective plane illumination microscopy" was invented by Igor Lyuboshenko (Le Plessis-Robinson, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system including correction and compensation subsystems is disclosed. The correction subsystem is coupled with a detection objective of an optical microscope of a light sheet microscope. The light sheet microscope includes an illumination source, optical elements, and the detection objective in a detection path of the optical microscope. The illumination source emits light that travels along an illumination path to illuminate a ...