ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,393, issued on May 20.
"Pixelated phase mask for chemical imaging" was invented by Adam M. Hanninen (Long Beach, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system for high-contrast, real-time analysis of a sample includes: a first radiation source configured to emit a first radiation beam onto the sample, wherein the first radiation beam comprises pulsed infrared (IR) light; a second radiation source configured to emit a second radiation beam onto the sample, wherein the second radiation beam comprises ultraviolet (UV) light, visible-spectrum light, or near-IR light; an imager configured to split the second radiation beam into a test fi...