US Patent Issued on March 18 for "Memory device with serial and parallel testing structure for sensing amplifiers" (Italian, German Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,938, issued on March 18.

"Memory device with serial and parallel testing structure for sensing amplifiers" was invented by ALberto Troia (Munich) and Antonino Mondello (Messina, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example memory device with an improved sensing structure including a memory array comprising a plurality of sub-arrays of memory cells and structured in memory blocks, sense amplifiers coupled to the memory cells, and modified JTAG cells coupled in parallel to the outputs of the sense amplifiers and serially interconnected in a scan-chain structure integrating a JTAG structure and the sense amplifiers. In the example m...