ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,642, issued on March 18.
"Automatic registration of multiple measurement devices" was invented by Jafar Amiri Parian (Schlieren, Switzerland).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method is performed by one or more processors to automatically register a plurality of captured data obtained using a respective measurement device, each of the captured data is obtained separately. The computer-implemented method includes accessing a first captured data of a portion of an environment, and a first image corresponding to said portion of the environment captured from a known relative position and angle with respect to the firs...