ALEXANDRIA, Va., June 25 -- United States Patent no. 12,341,554, issued on June 24.
"Jitter measurement of the multi-level PAM eye diagram" was invented by Donghong Wu (Union City, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for measuring litter in multi-level Pulse Amplitude Modulation (PAMn) eye diagrams, employing one-way analysis of variance (ANOVA) and image processing techniques. The procedure begins by importing a photo or digital file of a PAMn eye diagram and editing it to form a one Unit Interval (1UI) PAMn pattern. It proceeds by acquiring vertical histograms along the amplitude axis for both the horizontal lane (hlane) at the middle of a level and mixed lanes at one end of the ...