US Patent Issued on Feb. 10 for "Method for detecting anomalies in images using a plurality of machine learning programs" (German Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,135, issued on Feb. 10.

"Method for detecting anomalies in images using a plurality of machine learning programs" was invented by Paul Bergmann (Munich), Kilian Batzner (Holzkirchen, Germany), Michael Fauser (Munich) and David Sattlegger (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "This invention relates generally to machine vision systems, and more particularly, to the detection of anomalies in scenes observed by imaging sensors."

The patent was filed on Jan. 19, 2022, under Application No. 17/579,396.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=...