ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,976, issued on Dec. 9.
"Biaxial test device" was invented by Pei Wang (Nanchang, China), Zhenyu Yin (Nanchang, China), Changjie Xu (Nanchang, China), Dehai Wang (Nanchang, China), Wenbo Chen (Nanchang, China) and Daoyuan Tan (Nanchang, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention discloses a biaxial test device, comprising: a bracket, a container, a sample setting assembly and a press, etc. Before use, the sample is installed between two limit plates. On the basis of applying confining pressure, the press is started, and the pressure rod moves vertically downward and applies a vertical downward load to the sample. When the sampl...