US Patent Issued on Dec. 16 for "Statistical measurement with active learning for privacy protection evaluation" (American, Chinese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,251, issued on Dec. 16.

"Statistical measurement with active learning for privacy protection evaluation" was invented by Bo Jiang (Culver City, Calif.), Jian Du (Culver City, Calif.) and Qiang Yan (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and systems for evaluating privacy protection are provided. A method includes determining a first sub-dataset of a first dataset based on a sampling rate, a tolerance, and a first threshold. The method also includes determining a second sub-dataset of the first dataset based on the sampling rate, the tolerance, and a second threshold. The method includes determining a first distance between th...