US Patent Issued on Dec. 16 for "Electrical testing device with probe having an adjustable angle" (Wisconsin Inventor)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,398, issued on Dec. 16.

"Electrical testing device with probe having an adjustable angle" was invented by Nicholas A. Gabbey (Mount Pleasant, Wis.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device for testing a voltage level in an electrical terminal cavity having a testing body and a test lead for insertion into the electrical terminal cavity. The test lead includes a non-flexible portion configured to be attached to the testing body, a non-flexible probe configured to be inserted into the electrical terminal cavity, and a flexible connector extending between the non-flexible portion and the non-flexible probe such that the flexible connector...