ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,394, issued on Aug. 5.
"Test connector device and manufacturing method of terminal block thereof" was invented by Jih-szu Wang (New Taipei, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a test connector device for testing a component to be tested having conductive portions. The test connector device includes a base, a terminal block, and a limiting member. The terminal block is disposed on the base. The terminal block includes a substrate and terminals arranged in multiple rows and formed in an integral form with the substrate. Each of the terminals includes a first contact end and a second contact end correspon...