ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,827, issued on Aug. 12.
"Time-resolved spectrum rapid measurement system and method" was invented by Zhenyou Wang (Guangzhou, China), Bi-Xiao Wang (Guangzhou, China), Mengyao Guo (Guangzhou, China) and Guangyou Fang (Guangzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a time-resolved spectrum rapid measurement system and method, the system including a pulse laser module, a sample stage module, a control computer module, a detector module, a spectrometer module, and a multi-path delay module. The multi-path delay module is configured to split the signal light produced by the samples in the sample stage module to form a plural...