ALEXANDRIA, Va., April 9 -- United States Patent no. 12,272,037, issued on April 8.
"Dual-mode restoration microscopy" was invented by Li-Ling Yang (Berlin), Christian Conrad (Berlin), Foo Wei Ten (Berlin) and Roland Eils (Berlin).
According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope system (100) configured to record images in at least a first and a second imaging mode (501, 502), comprising: An objective (1) collecting light (201) from a sample (11), An illumination module coupled to the objective, A first reimaging objective (5) generating an intermediate image of the sample and a second reimaging objective (6) that relays the intermediate image onto a detection module, An evaluation module (200) comp...