INTERNATIONAL PATENT: ZTE CORPORATION, 中兴通讯股份有限公司 FILES APPLICATION FOR "TEST METHOD FOR INSPECTION DATA OF AOI DEVICE AND CENTRALIZED DETERMINATION INTEGRATED PROCESSING SYSTEM"

GENEVA, June 30 -- ZTE CORPORATION (ZTE Plaza, Keji Road South, Hi-Tech Industrial Park, Nanshan DistrictShenzhen, Guangdong 518057), 中兴通讯股份有限公司 (中国广东省深圳市南山区高新技术产业园科技南路中兴通讯大厦) filed a patent application (PCT/CN2024/129103) for "TEST METHOD FOR INSPECTION DATA OF AOI DEVICE, AND CENTRALIZED DETERMINATION INTEGRATED PROCESSING SYSTEM" on Oct 31, 2024. With publication no. WO/2025/130377, the details related to the patent application was published on Jun 26, 2025.

Notably, the pate...