GENEVA, Nov. 17 -- ZTE CORPORATION (ZTE Plaza, Keji Road South, Hi-Tech Industrial Park, NanshanShenzhen, Guangdong 518057), 中兴通讯股份有限公司 (中国广东省深圳市南山区高新技术产业园科技南路中兴通讯大厦) filed a patent application (PCT/CN2025/089813) for "SAMPLE DATA CORRECTION METHOD, EVENT LABEL DETERMINATION METHOD, AND DEVICE AND PROGRAM PRODUCT" on Apr 18, 2025. With publication no. WO/2025/232503, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was ...