GENEVA, July 28 -- ZENNER METERING TECHNOLOGY (SHANGHAI) LTD. (No. 800, Songda RoadQingpu District, Shanghai 201799), 上海真兰仪表科技股份有限公司 (中国上海市青浦区崧达路800号) filed a patent application (PCT/CN2024/114205) for "OPTIMIZATION METHOD BASED ON ULTRASONIC GAS METER METERING DATA" on Aug 23, 2024. With publication no. WO/2025/152437, the details related to the patent application was published on Jul 24, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organizati...