GENEVA, Dec. 7 -- YANGTZE MEMORY TECHNOLOGIES CO., LTD. (No.88 Weilai 3rd Road, East Lake High-tech Development ZoneWuhan, Hubei 430000) filed a patent application (PCT/CN2024/095740) for "METHOD AND TESTING SYSTEM FOR TESTING SEMICONDUCTOR CHIP PACKAGES" on May 28, 2024. With publication no. WO/2025/245690, the details related to the patent application was published on Dec 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WANG, Guanshuai (No.88 Weilai 3rd Road, East Lake High-tech Development ZoneWuhan, Hubei 430000), WANG, Chao (No.88 Weilai 3rd Road, East Lake High-tech Development Zone...