INTERNATIONAL PATENT: YALE UNIVERSITY FILES APPLICATION FOR "THREE-DIMENSIONAL VOLUMETRIC ANALYSIS"

GENEVA, Dec. 31 -- YALE UNIVERSITY (Two Whitney AvenueNew Haven, Connecticut 06510) filed a patent application (PCT/US2025/034786) for "THREE-DIMENSIONAL VOLUMETRIC ANALYSIS" on Jun 23, 2025. With publication no. WO/2025/265119, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BUONO, Frank (Yale Universityc/o Yale Ventures101 College Street, Suite 200New Haven, Connecticut 06510), WIZNIA, Daniel (Yale Universityc/o Yale Ventures101 College Street, Suite 200New Haven, Connecticut 06510), TOMMASINI, Steven (Yale Universityc/...