INTERNATIONAL PATENT: XIAMEN SAN'AN INTEGRATED CIRCUIT CO., LTD., 厦门市三安集成电路有限公司 FILES APPLICATION FOR "SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR WAFER AND MOBILITY TESTING METHOD"

GENEVA, April 18 -- XIAMEN SAN'AN INTEGRATED CIRCUIT CO., LTD. (No. 753-799, Min'an AvenueHongtang Town, Tong'an DistrictXiamen, Fujian 361100), 厦门市三安集成电路有限公司 (中国福建省厦门市同安区洪塘镇民安大道753-799号) filed a patent application (PCT/CN2023/124536) for "SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR WAFER, AND MOBILITY TESTING METHOD" on Oct 13, 2023. With publication no. WO/2025/076823, the details related to the patent application was published on Apr 17, 2025.

Notably, the patent application was submitted under the International Pate...